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Volumn 246, Issue 3-4, 2002, Pages 230-236
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Surface polarity dependence of decomposition and growth of GaN studied using in situ gravimetric monitoring
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Author keywords
A1. Etching; A1. Surface processes; A3. Vapor phase epitaxy; B1. Nitrides; B2. Semiconducting gallium compounds
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Indexed keywords
CRYSTAL LATTICES;
DECOMPOSITION;
ETCHING;
GALLIUM NITRIDE;
GRAVIMETRIC ANALYSIS;
HIGH TEMPERATURE EFFECTS;
SUBSTRATES;
SURFACE PHENOMENA;
GRAVIMETRIC MONITORING (GM);
VAPOR PHASE EPITAXY;
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EID: 0037121692
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(02)01746-3 Document Type: Conference Paper |
Times cited : (49)
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References (12)
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