Comparison of magnetic- and chemical-boundary roughness in magnetic films and multilayers

Journal of Applied Physics

Volumn 91, Issue 12, 2002, Pages 9978-9986

  Kelly, J J ^a   Barnes, B M ^a   Flack, F ^a   Lagally, D P ^a   Savage, D E ^a   Friesen, M ^a   Lagally, M G ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CO FILMS; COMPETING MODELS; HYSTERESIS MEASUREMENTS; MAGNETIC FILMS AND MULTILAYERS; MAGNETIC PROPERTIES OF INTERFACES; NONMAGNETICS; X-RAY RESONANT MAGNETIC SCATTERING;

FILM PREPARATION; MAGNETIC PROPERTIES; MAGNETISM; METALLIC FILMS; THIN FILMS;

MAGNETIC MULTILAYERS;

EID: 0037098035     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1478142     Document Type: Article

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