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Volumn 283, Issue 1-3, 2000, Pages 157-161

Roughness in sputtered multilayers analyzed by transmission electron microscopy and X-ray diffuse scattering

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CORRELATION METHODS; SPUTTERING; SURFACE ROUGHNESS; SYNCHROTRON RADIATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS; X RAY SCATTERING;

EID: 0033743459     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)01918-3     Document Type: Article
Times cited : (8)

References (15)
  • 1
    • 0004055759 scopus 로고
    • Bellingham, WA: SPIE Engineering Press
    • Spiller E. Soft X-ray Optics. 1994;SPIE Engineering Press, Bellingham, WA.
    • (1994) Soft X-ray Optics
    • Spiller, E.1
  • 2
    • 85031575176 scopus 로고    scopus 로고
    • The APS Coating Facilities
    • April
    • C. Liu, J. Erdmann, A. Macrander, The APS Coating Facilities, SRI-CAT Newsletter, April 1997, Vol. 3, pp. 2-4, http://www.aps.anl.gov/sricat/news.html.
    • (1997) SRI-CAT Newsletter , vol.3 , pp. 2-4
    • Liu, C.1    Erdmann, J.2    Macrander, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.