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Volumn 283, Issue 1-3, 2000, Pages 157-161
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Roughness in sputtered multilayers analyzed by transmission electron microscopy and X-ray diffuse scattering
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Author keywords
[No Author keywords available]
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Indexed keywords
APPROXIMATION THEORY;
CORRELATION METHODS;
SPUTTERING;
SURFACE ROUGHNESS;
SYNCHROTRON RADIATION;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY ANALYSIS;
X RAY SCATTERING;
BORN APPROXIMATION;
X RAY DIFFUSE SCATTERING;
MULTILAYERS;
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EID: 0033743459
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4526(99)01918-3 Document Type: Article |
Times cited : (8)
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References (15)
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