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Volumn 91, Issue 10, 2002, Pages 8138-8140
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Ultrahigh vacuum scanning tunneling microscopy/magnetic force microscopy study of ultrathin iron films grown on polycrystalline nickel oxide films
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Author keywords
[No Author keywords available]
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Indexed keywords
ANTIFERROMAGNETICS;
AVERAGE DOMAIN SIZE;
CONTINUOUS DOMAIN;
FERROMAGNETIC FILMS;
FORCE MICROSCOPY;
GROWTH MECHANISMS;
IN-PLANE MAGNETIZATION;
IRON FILM;
MAGNETIC FORCE;
MAGNETIC GRAINS;
MAGNETIC INTERACTIONS;
NIO FILMS;
POLYCRYSTALLINE;
POLYCRYSTALLINE FILM;
POLYCRYSTALLINE NICKELS;
THICKNESS DEPENDENCE;
ULTRA-THIN;
ULTRAHIGH VACUUM SCANNING TUNNELING MICROSCOPIES;
ULTRATHIN FE FILMS;
ULTRATHIN LAYERS;
ANTIFERROMAGNETISM;
CRITICAL CURRENTS;
CRYSTALLOGRAPHY;
IRON;
MAGNETIC DOMAINS;
MAGNETIC FORCE MICROSCOPY;
NICKEL OXIDE;
THICK FILMS;
ULTRAHIGH VACUUM;
ULTRATHIN FILMS;
OXIDE FILMS;
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EID: 0037094958
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1447216 Document Type: Article |
Times cited : (2)
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References (10)
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