Exchange anisotropy in NiFe/Fe-doped NiO bilayers

Journal of Applied Physics

Volumn 81, Issue 8 PART 2B, 1997, Pages 4990-4992

  Lai, Chih Huang ^a   Bailey, William E ^a   White, Robert L ^a   Anthony, Thomas C ^b  

^a Stanford University   (United States)

^b HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039126918     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364963     Document Type: Article

References (8)

1. M. J. Carey and A. E. Berkowitz, Appl. Phys. Lett. 60, 3060 (1992).
2. T. C. Anthony, J. A. Brug, and S. Zhang, IEEE Trans. Magn. 30, 3819 (1994).
3. C. H. Lai, H. Matsuyama, R. L. White, T. C. Anthony, and G. G. Bush, J. Appl. Phys. 79, 6389 (1996).
4. D. Paccard, C. Schlenker, O. Massenet, R. Montmory, and A. Yelon, 16, 301 (1968).
5. A. P. Malozemoff, J. Appl. Phys. 63, 3874 (1988).
6. J. Kanamori, Prog. Theor. Phys. 17, 197 (1957).
7. C. H. Lai, T. C. Anthony, E. Iwamura, and R. L. White, IEEE Trans. Magn. 32, 3419 (1996).
8. C. H. Lai and R. L. White (unpublished).