Microstructure and electric properties of lead lanthanum titanate thin film under transverse electric fields

Journal of Applied Physics

Volumn 91, Issue 6, 2002, Pages 3779-3784

  Song, Z T ^a,b   Chan, H L W ^a   Ding, Y P ^a   Chong, N ^a   Choy, C L ^a  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^b SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AC VOLTAGE; CABLE LENGTH; COERCIVE FIELD; CRYSTALLINE STRUCTURE; DIELECTRIC RESPONSE; ELECTRICAL MEASUREMENT; GROWTH BEHAVIOR; HIGH FREQUENCY; INTER-DIGITATED ELECTRODES; LEAD LANTHANUM TITANATE; LOSS TANGENT; LOW FREQUENCY RANGE; METAL ORGANIC DEPOSITION; MOD PROCESS; PEROVSKITE STRUCTURES; POLYCRYSTALLINE; RESONANCE PEAK; STRAY INDUCTANCES; TRANSVERSE ELECTRIC FIELD; TRAPPED CHARGE;

CABLES; DEPOSITION; ELECTRIC FIELDS; PEROVSKITE; SCANNING ELECTRON MICROSCOPY; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION; ZIRCONIUM ALLOYS;

ELECTRIC PROPERTIES;

EID: 0037087440     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1448867     Document Type: Article

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