Hot carrier effect in low-temperature poly-Si p-ch thin-film transistors under dynamic stress

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 41, Issue 1 A/B, 2002, Pages

  Uraoka, Yukiharu ^a   Yano, Hiroshi ^a   Hatayama, Tomoaki ^a   Fuyuki, Takashi ^a  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

Hot carrier; Low temperature poly Si; Reliability; TFT

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRON TRAPS; HOT CARRIERS; LOW TEMPERATURE EFFECTS; POLYSILICON;

DYNAMIC STRESS;

THIN FILM TRANSISTORS;

EID: 0037082075     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.l13     Document Type: Article

References (9)