Analysis of hot carrier effects in low temperature poly-Si TFTs using device simulator

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 2001, Pages 251-256

  Uraoka, Y ^a   Hatayama, T ^a   Fuyuki, T ^a   Kawamura, T ^a   Tsuchihashi, Y ^a  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

POLYSILICON; RELIABILITY; TEMPERATURE; THIN FILM TRANSISTORS;

DEVICE SIMULATOR; HOT CARRIER EFFECTS;

HOT CARRIERS;

EID: 0034874017     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)