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Volumn 91, Issue 2, 2002, Pages 633-638

Reaction of the Si/Ta/Ti system: C40 TiSi2 phase formation and in situ kinetics

b INFM (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

FILM MORPHOLOGY; IN-SITU; INTERMEDIATE PHASE; NUCLEATION DENSITIES; PHASE FORMATIONS; TRANSFORMATION KINETICS;

ACTIVATION ENERGY; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

PHASE INTERFACES;

EID: 0037080509 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1421212 Document Type: Article

Times cited : (9)

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