|
|
Volumn 55, Issue 1-4, 2001, Pages 123-128
|
|
Effect of a thin Ta layer on the C49-C54 transition
|
|
Author keywords
[No Author keywords available]
|
|
Indexed keywords
ELECTRIC RESISTANCE MEASUREMENT;
IMAGE ANALYSIS;
INTERFACES (MATERIALS);
PHASE TRANSITIONS;
RAMAN SPECTROSCOPY;
TANTALUM;
IMAGE ANALYSIS;
SHEET RESISTANCE MEASUREMENTS;
TITANIUM COMPOUNDS;
|
|
EID: 0034817849
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/S0167-9317(00)00437-8 Document Type: Article |
|
Times cited : (4)
|
|
References (8)
|
