Surface structure of Si(100) with submonolayer coverages of C

Materials Science and Engineering: B

Volumn 89, Issue 1-3, 2002, Pages 415-419

  Jemander, S T ^a   Zhang, H M ^a   Uhrberg, R I G ^a   Hansson, G V ^a  

^a LINKÖPING UNIVERSITY   (Sweden)

Author keywords

Carbon; Reconstruction; Si(100); Silicon; STM; Surface

Indexed keywords

ANNEALING; AUGER ELECTRON SPECTROSCOPY; CARBON; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; MONOLAYERS; SCANNING ELECTRON MICROSCOPY; SURFACE STRUCTURE;

SURFACE RECONSTRUCTION;

SEMICONDUCTING SILICON;

EID: 0037074776     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(01)00845-5     Document Type: Conference Paper

References (9)