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Applied Physics A: Materials Science and Processing

Volumn 72, Issue 8, 2001, Pages

Imaging surface electronic structure of NiAl(110) using low-temperature scanning tunneling microscopy

(5) Song, Z a Pascual, J I a Conrad, H a Horn, K a Rust, H P a

a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER TRANSFORMS; NICKEL COMPOUNDS; PHOTOEMISSION; PROBABILITY DENSITY FUNCTION; RESONANCE; SCANNING TUNNELING MICROSCOPY; SURFACE TOPOGRAPHY;

CONDUCTANCE IMAGES; NICKEL ALUMINIDE;

ELECTRONIC STRUCTURE;

EID: 0034844233 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s003390100747 Document Type: Article

Times cited : (9)

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