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Volumn 477, Issue 1, 2001, Pages 8-16
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Copper clusters on Al2O3/NiAl(110) studied with STM
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Author keywords
Adhesion; Aluminum oxide; Clusters; Copper; Growth; Metal insulator interfaces; Scanning tunneling microscopy
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Indexed keywords
ALUMINA;
CRYSTAL ORIENTATION;
METAL INSULATOR BOUNDARIES;
NANOSTRUCTURED MATERIALS;
NICKEL ALLOYS;
SCANNING TUNNELING MICROSCOPY;
ATOMIC RESOLUTION;
COPPER;
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EID: 0035836711
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(01)00703-8 Document Type: Article |
Times cited : (53)
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References (39)
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