Absolute measurement of roughness and lateral-correlation length of random surfaces by use of the simplified model of image-speckle contrast

Applied Optics

Volumn 41, Issue 20, 2002, Pages 4148-4156

  Chuanfu, Cheng ^a   Chunxiang, Liu ^b   Ningyu, Zhang ^c   Tianqing, Jia ^a   Ruxin, Li ^a   Zhizhan, Xu ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

^b SHANDONG NORMAL UNIVERSITY   (China)

^c SHANDONG JIANZHU UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MATHEMATICAL MODELS; OPTICAL CORRELATION; SURFACE ROUGHNESS;

GAUSSIAN CORRELATIONS;

SPECKLE;

EID: 0037055177     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.004148     Document Type: Article

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