Morphological analysis by atomic force microscope and light scattering study for random scattering screens

Wuli Xuebao/Acta Physica Sinica

Volumn 49, Issue 7, 2000, Pages 1265-1266

  Qi, Dong Ping ^a,b   Liu, De Li ^b   Teng, Shu Yun ^b   Zhang, Ning Yu ^b   Cheng, Chuan Fu ^b  

^a SHANDONG UNIVERSITY OF TECHNOLOGY   (China)

^b SHANDONG NORMAL UNIVERSITY   (China)

Author keywords

Light scattering; Random screen; Self affine fractal surface

Indexed keywords

EID: 0041682881     PISSN: 10003290     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (12)

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