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Thin Solid Films

Volumn 406, Issue 1-2, 2002, Pages 64-69

Pore structure, barrier layer topography and matrix alumina structure of porous anodic alumina film

(5) Sui, Y C a,b Cui, B Z c Martinez L d Perez, R b Sellmyer, D J a

a UNIVERSITY OF NEBRASKA LINCOLN (United States)

b INSTITUTO MEXICANO DEL PETRÓLEO (Mexico)

c KANSAS STATE UNIVERSITY (United States)

d INSTITUTO DE CIENCIAS FÍSICAS (Mexico)

Author keywords

AFM; Anodic oxidation; Carbon; Chemical vapor deposition; Nanostructures; TEM

Indexed keywords

ALUMINA; ANODIC OXIDATION; ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; ELECTRIC POTENTIAL; NANOSTRUCTURED MATERIALS; POROUS MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

MATRIX ALUMINA STRUCTURE;

THIN FILMS;

EID: 0037051242 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(01)01769-2 Document Type: Article

Times cited : (66)

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