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Volumn 35, Issue 9, 2002, Pages
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Engineering and investigating the control of semiconductor surfaces and interfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
CHARGE TRANSFER;
CURRENT VOLTAGE CHARACTERISTICS;
HETEROJUNCTIONS;
INTERFACES (MATERIALS);
NANOTECHNOLOGY;
PASSIVATION;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DEVICE MANUFACTURE;
SURFACE PROPERTIES;
X RAY PHOTOELECTRON SPECTROSCOPY;
ATOMIC SCALE DEFECTS;
CARRIER CONFINEMENT;
FLAT BAND CONDITION;
FREE SURFACES;
INTERFACE BARRIERS;
LASER FACET;
MULTI-QUANTUM BARRIERS;
SCHOTTKY CONTACTS;
QUANTUM WELL LASERS;
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EID: 0037035442
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/35/9/202 Document Type: Review |
Times cited : (18)
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References (64)
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