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Volumn 35, Issue 9, 2002, Pages

Engineering and investigating the control of semiconductor surfaces and interfaces

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CHARGE TRANSFER; CURRENT VOLTAGE CHARACTERISTICS; HETEROJUNCTIONS; INTERFACES (MATERIALS); NANOTECHNOLOGY; PASSIVATION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SURFACE PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0037035442     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/35/9/202     Document Type: Review
Times cited : (18)

References (64)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.