Measuring surface stress discontinuities in self-organized systems with X rays

Physical Review Letters

Volumn 88, Issue 5, 2002, Pages 561031-561034

  Croset, B ^a   Girard, Y ^a   Prevot G ^a   Sotto, M ^a   Garreau, Y ^b   Pinchaux, R ^a,b   Sauvage Simkin, M ^b,c  

^a SORBONNE UNIVERSITÉ   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

^c UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMISORPTION; ELASTICITY; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR DYNAMICS; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; STRESS RELAXATION; X RAY DIFFRACTION ANALYSIS;

GRAZING INCIDENCE X-RAY DIFFRACTION (GIXD);

SURFACE MEASUREMENT;

EID: 0037017067     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.88.056103     Document Type: Article

References (26)