Surface relaxation and near-surface atomic displacements in the N/Cu(1 0 0) self-ordered system

Surface Science

Volumn 490, Issue 3, 2001, Pages 336-350

  Cohen, C ^a   Ellmer, H ^a   Guigner, J M ^a   L'Hoir, A ^a   Prevot G ^a   Schmaus, D ^a   Sotto, M ^a  

^a CNRS   (France)

Author keywords

Copper; High energy ion scattering (HEIS); Molecular dynamics; Nitrogen atom; Nuclear reaction analysis; Self assembly; Surface relaxation and reconstruction; Surface stress

Indexed keywords

COMPRESSIVE STRESS; COMPUTER SIMULATION; COPPER; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR DYNAMICS; NITROGEN; SCANNING TUNNELING MICROSCOPY; STRESS RELAXATION; SURFACE REACTIONS; SURFACE STRUCTURE; SURFACE TENSION; TENSILE STRESS;

ATOMIC DISPLACEMENTS; SURFACE RELAXATION;

GAS ADSORPTION;

EID: 0035840168     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01353-X     Document Type: Article

References (30)