SCOPUS 정보 검색 플랫폼

Advanced Materials

Volumn 14, Issue 1, 2002, Pages 38-41

Explosive nanocrystalline porous silicon and its use in atomic emission spectroscopy

(3) Mikulec, F V a Kirtland, J D a Sailor, M J a

a UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOPING (ADDITIVES); EMISSION SPECTROSCOPY; GADOLINIUM COMPOUNDS; NANOSTRUCTURED MATERIALS;

ATOMIC EMISSION SPECTROSCOPY (AES);

POROUS SILICON;

EID: 0037016611 PISSN: 09359648 EISSN: None Source Type: Journal
DOI: 10.1002/1521-4095(20020104)14:1<38::AID-ADMA38>3.0.CO;2-Z Document Type: Article

Times cited : (101)

References (24)

1
- 0004140205
- EMIS Datareviews, Short Run Press, London
- (1997) Properties of Porous Silicon
- Canham, L.T.¹

2
- 0025386899
- (1990) J. Electrochem. Soc. , vol.137 , pp. 653
- Lehmann, V.¹ Foll, H.²

3
- 0026946919
- (1992) J. Electrochem. Soc. , vol.139 , pp. 3373
- Searson, P.C.¹ Macaulay, J.M.² Prokes, S.M.³

4
- 0032567213
- (1998) J. Am. Chem. Soc. , vol.120 , Issue.12 , pp. 108
- Janshoff, A.¹ Dancil, K.P.S.² Steinem, C.³ Greiner, D.P.⁴ Lin, V.S.Y.⁵ Gurtner, C.⁶ Motesharei, K.⁷ Sailor, M.J.⁸ Ghadiri, M.R.⁹

5
- 0026882020
- (1992) Science , vol.256 , pp. 1791
- Doan, V.V.¹ Sailor, M.J.²

6
- 0032542258
- (1998) Angew. Chem. Int. Ed. , vol.37 , pp. 3257
- Stewart, M.P.¹ Buriak, J.M.²

7
- 0000107329
- (2000) Appl. Phys. Lett. , vol.77 , pp. 2572
- Li, X.¹ Bohn, P.W.²

8
- 0000513950
- (1987) J. Appl. Phys. , vol.62 , pp. 1622
- Benson, D.A.¹ Larsen, M.E.² Renlund, A.M.³ Trott, W.M.⁴ Bickes, R.W.⁵

9
- 0035121216
- (2001) Computer , vol.34 , pp. 44
- Warneke, B.¹ Last, M.² Liebowitz, B.³ Pister, K.S.J.⁴

10
- 0031559478
- (1997) Adv. Mater. , vol.9 , pp. 783
- Sailor, M.J.¹ Lee, E.J.²

11
- 0002437827
- (1992) Science , vol.257 , pp. 68
- McCord, P.¹ Yau, S.L.² Bard, A.J.³

12
- 0028134359
- (1994) J. Electron. Mater. , vol.23 , pp. 57
- Milewski, P.D.¹ Lichtenwalner, D.J.² Mehta, P.³ Kingon, A.I.⁴ Zhang, D.⁵ Kolbas, R.M.⁶

13
- 0035816993
- (2001) Phys. Rev. Lett. , vol.87 , pp. 68301
- Kovalev, D.¹ Timoshenko, V.Y.² Künzner, N.³ Gross, E.⁴ Koch, F.⁵

14
- 0003998388
- CRC Press, Boca Raton, FL
- (1990) CRC Handbook of Chemistry and Physics, 60th ed.

15
- 0007995730
- Pergamon, New York
- (1965) Chemistry and Technology of Explosives , vol.3 , pp. 340
- Urbanski, T.¹

16
- 0007573096
- Interscience, New York
- (1963) Chemical Analysis by Flame Photometry, 2nd rev. ed. , pp. 370-431
- Herrmann, R.¹ Alkemade, C.T.J.²

17
- 0007998158
- (1992) Mater. Res. Soc. Symp. Proc. , vol.256 , pp. 63
- Canham, L.T.¹ Blackmore, G.W.²

18
- 0003023327
- Ed: L. T. Canham, INSPEC, London
- (1997) Properties of Porous Silicon , pp. 336-339
- Canham, L.T.¹

19
- 0015658516
- (1973) J. Electrochem. Soc. , vol.120 , pp. 1106
- Knolle, W.R.¹ Retajczyk Jr., T.F.²

20
- 4243923227
- Laurin, Pittsfield
- (2000) The Photonics Design and Applications Handbook, 46th ed.
- Muehlemann, M.¹

21
- 0004222516
- Saunders College Publishing, Fort Worth, TX
- (1992) Principles of Instrumental Analysis, 4th ed. , pp. 196-232
- Skoog, D.A.¹ Leary, J.J.²

22
- 0002547648
- (1994) Fresenius J. Anal. Chem. , vol.349 , pp. 32
- Golloch, A.¹ Seidel, T.²

23
- 0007999059
- (1996) J. Phys. Chem. , vol.100 , pp. 3646
- Van Patten, P.G.¹ Noll, J.D.² Myrick, M.L.³ Li, C.R.⁴ Sudarshan, T.S.⁵

24
- 0343825637
- (1997) J. Vac. Sci. Technol. B , vol.15 , pp. 282
- Vau Patten, P.G.¹ Noll, J.D.² Myrick, M.L.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.