Spark-gap atomic emission microscopy. II. Improvements in resolution

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 15, Issue 2, 1997, Pages 282-286

  Van Patten, P G ^a,b   Noll, J D ^a   Myrick, M L ^a  

^a UNIVERSITY OF SOUTH CAROLINA   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343825637     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589279     Document Type: Article

References (7)

1. P. G. Van Patten, J. D. Noll, T. S. Sudarshan, C. R. Li, and M. L. Myrick, J. Phys. Chem. 100, 3646 (1996).
2. A. Scheeline, Prog. Analyt. Atom. Spectrosc. 7, 21 (1984).
3. O. Albrektsen, H. W. M. Salemink, K. A. Mørch, and A. T. Thölen, J. Vac. Sci. Technol. B 12, 3187 (1994).
4. R. Zhang and D. G. Ivey, J. Vac. Sci. Technol. B 14, 1 (1996).
5. C. B. Ross, Jr., Ph.D. thesis, Purdue University, 1969.
6. A. G. Shenstone, Philos. Trans. R. Soc. London Ser. A 241, 297 (1948).
7. This effect is well known and is a result of the fact that the tip has a nonzero radius of curvature. The STM image is really a convolution of surface and tip topography. Very tall, sharp, protrusions, for example, often reveal the shape of the tip in the STM image. The apparent radius of any tall protrusion, then, is actually the true radius of the protrusion plus some effective radius of the tip.