Free-standing semiconductor micro- and nano-objects

Materials Science and Engineering C

Volumn 19, Issue 1-2, 2002, Pages 393-396

  Schmidt, O G ^a   Deneke, C ^a   Schmarje, N ^a   Muller C ^a   Jin Phillipp, N Y ^a  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

Bilayer thickness; InGaAs GaAs tube; Semiconductor

Indexed keywords

MEMBRANES; NANOSTRUCTURED MATERIALS; SUBSTRATES;

VERTICAL MEMBRANES;

SEMICONDUCTOR MATERIALS;

SEMICONDUCTOR;

EID: 0037005927     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0928-4931(01)00428-3     Document Type: Article

References (8)