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Volumn 41, Issue 12, 2002, Pages 7338-7344

Narrow trench corrosion of copper damascene interconnects

Author keywords

Chemical mechanical polishing; Copper; Corrosion; Damascene; Etching; Inorganic; Interconnection; LSI; Organic

Indexed keywords

ACETIC ACID; CHEMICAL MECHANICAL POLISHING; ETCHING; INORGANIC ACIDS; PITTING; SOLUTIONS;

EID: 0036991675     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.7338     Document Type: Article
Times cited : (23)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.