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Volumn 194, Issue 2 SPEC., 2002, Pages 559-562
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A mechanistic study of GaN laser lift-off
a
EPFL
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
DELAMINATION;
EXCIMER LASERS;
INTERFACES (MATERIALS);
LASER DAMAGE;
OPTICAL MICROSCOPY;
POLISHING;
PYROLYSIS;
SAPPHIRE;
SPECKLE;
THIN FILMS;
VAPOR PHASE EPITAXY;
HYDRIDE VAPOR PHASE EPITAXY;
LASER INDUCED DELAMINATION;
LASER LIFT OFF TECHNIQUE;
SAPPHIRE WAFERS;
GALLIUM NITRIDE;
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EID: 0036960017
PISSN: 00318965
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-396X(200212)194:2<559::AID-PSSA559>3.0.CO;2-S Document Type: Article |
Times cited : (7)
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References (16)
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