Determination of depth profiles of Ni80Fe20 epifilms on Mo buffered Al2O3 substrates with and without a Co interlayer by polarized neutron and X-ray reflectivity

Chinese Journal of Physics

Volumn 40, Issue 6, 2002, Pages 616-623

  Yu, Kuan Li ^a   Lee, Chih Hao ^a   Huang, J C A ^b   Su, Hui Chia ^a   Felcher, G P ^c  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036944293     PISSN: 05779073     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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