Magnetic depth profile at the interface of a permalloy/Co thin film studied by polarized neutron and X-ray reflectivity

Journal of Magnetism and Magnetic Materials

Volumn 209, Issue 1-3, 2000, Pages 110-112

  Lee, Chih Hao ^a   Yu, Kuan Li ^a   Lee, Ming Han ^a   Huang, J C A ^b   Felcher, G P ^c  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; COBALT; ELECTROMAGNETIC WAVE REFLECTION; INTERFACES (MATERIALS); METALLIC FILMS; NEUTRON REFLECTION; NICKEL ALLOYS; SURFACE ROUGHNESS; X RAY ANALYSIS;

PERMALLOY; X RAY REFLECTIVITY;

MAGNETIC THIN FILMS;

EID: 0034135340     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(99)00659-9     Document Type: Article

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