SCOPUS 정보 검색 플랫폼

Journal of Physics and Chemistry of Solids

Volumn 60, Issue 8, 1999, Pages 1491-1494

Study of the interface roughness using polarized neutron and X-ray reflectivity on MBE permalloy thin films

(4) Lee, C H a Yu, K L a Huang, J C A b Felcher, G c

a Nucl S ^* (Taiwan)

b NATIONAL CHENG KUNG UNIVERSITY (Taiwan)

c ARGONNE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOYS; CHROMIUM; INTERFACES (MATERIALS); IRON; MAGNETIC MOMENTS; MOLECULAR BEAM EPITAXY; NEUTRON REFLECTION; NICKEL; POLARIZATION; SAPPHIRE; THIN FILMS; X RAY DIFFRACTION;

CHEMICAL INTERFACE; INTERFACE ROUGHNESS; MAGNETIC INTERFACE; MAGNETIC STRUCTURE; PERMALLOY THIN FILMS;

SURFACE ROUGHNESS;

EID: 0032590529 PISSN: 00223697 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-3697(99)00151-1 Document Type: Article

Times cited : (2)

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