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Volumn 59, Issue 6, 2002, Pages 1053-1059

A small and compact AMS facility for tritium depth profiling

Author keywords

Electrostatic accelerators; Fusion; Mass spectrometry; Tritium

Indexed keywords

ELECTRIC INSULATION; FUSION REACTIONS; SECONDARY ION MASS SPECTROMETRY; TRITIUM;

EID: 0036918328     PISSN: 03044289     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12043-002-0155-8     Document Type: Conference Paper
Times cited : (7)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.