Tritium depth profiling in carbon by accelerator mass spectrometry

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 161, Issue , 2000, Pages 216-220

  Friedrich, M ^a   Pilz, W ^a   Sun, G ^a   Behrisch, R ^b   Garcia Rosales C ^b   Bekris, N ^c   Penzhorn, R D ^c  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^b MAX PLANCK INSTITUT FÜR PLASMAPHYSIK   (Germany)

^c KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CESIUM; DEUTERIUM; EROSION; FUSION REACTIONS; HYDROGEN; MASS SPECTROMETRY; NEGATIVE IONS; PARTICLE DETECTORS; PLASMAS; SPUTTERING; SURFACES;

ACCELERATOR MASS SPECTROMETRY; INJECTION MAGNET; SEMICONDUCTOR DETECTORS; TRITIUM DEPTH PROFILING;

TRITIUM;

EID: 0033877958     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00678-3     Document Type: Article

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