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Volumn , Issue , 2002, Pages 625-631

WTA-waveform-based timing analysis for deep submicron circuits

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT SIMULATION; DEEP SUBMICRON CIRCUITS; STATIC TIMING ANALYZERS; WAVEFORM BASED TIMING ANALYSIS;

EID: 0036911948     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/774572.774665     Document Type: Conference Paper
Times cited : (12)

References (9)
  • 1
    • 0000682349 scopus 로고
    • A switch-level timing verifier for digital MOS VLSI
    • July
    • J. Ousterhout, "A Switch-Level Timing Verifier for Digital MOS VLSI," IEEE Trans. On Computer-Aided Design, Vol. CAD-4, No. 3, July 1985, pp. 336-349.
    • (1985) IEEE Trans. On Computer-Aided Design , vol.CAD-4 , Issue.3 , pp. 336-349
    • Ousterhout, J.1
  • 2
    • 0023386645 scopus 로고
    • Timing analysis and performance improvement of MOS VLSI designs
    • July
    • N. Jouppi, "Timing Analysis and Performance Improvement of MOS VLSI Designs," IEEE Trans. On Computer Aided Design, Vol. CAD-6, No. 4, July 1987, pp. 650-665.
    • (1987) IEEE Trans. On Computer Aided Design , vol.CAD-6 , Issue.4 , pp. 650-665
    • Jouppi, N.1
  • 4
    • 0026837732 scopus 로고
    • Transistor-level estimation of worst-case delays in MOS VLSI circuits
    • March
    • M. Dagenais, S. Gaiotti and N. Rumin, "Transistor-Level Estimation of Worst-Case Delays in MOS VLSI Circuits," IEEE Trans. On Computer-Aided Design, Vol 11, No. 3, March 1992, pp. 384-395.
    • (1992) IEEE Trans. On Computer-Aided Design , vol.11 , Issue.3 , pp. 384-395
    • Dagenais, M.1    Gaiotti, S.2    Rumin, N.3
  • 7
    • 0029708442 scopus 로고    scopus 로고
    • A systematic technique for verifying critical path delays in a 300 MHz alpha CPU design using circuit simulation
    • M. Desai and Y. Yen, "A Systematic Technique for Verifying Critical Path Delays in a 300 MHz Alpha CPU Design Using Circuit Simulation," Proc. of the 33rd Design Automation Conference, 1996.
    • Proc. of the 33rd Design Automation Conference, 1996
    • Desai, M.1    Yen, Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.