Fast anti-random (FAR) test generation to improve the quality of behavioral model verification

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 18, Issue 6, 2002, Pages 583-594

  Chen, Tom ^a   Bai, Andre ^a   Hajjar, Amjad ^a   Amschler Andrews, Anneliese ^b   Anderson, C ^c  

^a Engineering Research Center and Hydraulics Laboratory   (United States)

^b Washington State University   (United States)

^c Colorado State University   (United States)

Author keywords

Anti random testing; Code coverage improvement; Test data generation

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; COMPUTER HARDWARE DESCRIPTION LANGUAGES; COMPUTER SIMULATION; COMPUTER SOFTWARE SELECTION AND EVALUATION; FAILURE ANALYSIS; VECTORS;

AUTOMATIC TEST PATTERN GENERATION; BEHAVIORAL MODEL VERIFICATION; CODE COVERAGE IMPROVEMENT; FAST ANTI RANDOM TESTING; TEST DATA GENERATION;

AUTOMATIC TESTING;

EID: 0036910639     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1020844805564     Document Type: Article

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