Validation vector grade (VVG): a new coverage metric for validation and test

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1999, Pages 182-187

  Thaker, Pradip A ^a   Agrawal, Vishwani D ^a   Zaghloul, Mona E ^a  

^a HUGHES NETWORK SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE DESCRIPTION LANGUAGES; DESIGN FOR TESTABILITY; FAILURE ANALYSIS; GATES (TRANSISTOR); INTEGRATED CIRCUIT LAYOUT; VLSI CIRCUITS;

GATE LEVEL FAULT COVERAGE; STRUCTURAL FAULT COVERAGE; VALIDATION VECTOR GRADE;

INTEGRATED CIRCUIT TESTING;

EID: 0032639198     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (28)