Real-time high-resolution topographic imagery using interference microscopy

EPJ Applied Physics

Volumn 20, Issue 3, 2002, Pages 169-175

  Dubois, A ^a   Vabre, L ^a   Boccara, A C ^a   Montgomery, P C ^b   Cunin, B ^b   Reibel, Y ^b   Draman, C ^c  

^a PSL RESEARCH UNIVERSITY   (France)

^b CNRS   (France)

^c Faculté de Médecine   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; INTERFEROMETRY; MORPHOLOGY; OPTICAL RESOLVING POWER; PHASE SHIFT; SCANNING ELECTRON MICROSCOPY; SURFACES;

PHASE-SHIFTING INTERFEROMETRY;

IMAGING TECHNIQUES;

EID: 0036897709     PISSN: 12860042     EISSN: None     Source Type: Journal    
DOI: 10.1051/epjap:2002088     Document Type: Article

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