Real-time reflectivity and topography imagery of depth-resolved microscopic surfaces

Optics Letters

Volumn 24, Issue 5, 1999, Pages 309-311

  Dubois, A ^a   Boccara, A C ^a   Lebec, M ^b  

^a PSL RESEARCH UNIVERSITY   (France)

^b UNIVERSITÉ PARIS EST CRÉTEIL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001349426     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.24.000309     Document Type: Article

References (6)

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3. G. S. Kino and S. C. Chim, Appl. Opt. 29, 3775 (1990).
4. F. C. Chang and G. S. Kino, Appl. Opt. 37, 3471 (1998).
5. E. Beaurepaire, A. C. Boccara, M. Lebec, L. Blanchot, and H. Saint-Jalmes, Opt. Lett. 23, 244 (1998).
6. C. J. R. Sheppard and T. Wilson, Appl. Phys. Lett. 38, 858 (1981).