Heteroepitaxial growth of single-phase zinc blende ZnS films on transparent substrates by pulsed laser deposition under H2S atmosphere

Solid State Communications

Volumn 124, Issue 10-11, 2002, Pages 411-415

  Hiramatsu, Hidenori ^a   Ohta, Hiromichi ^a   Hirano, Masahiro ^a   Hosono, Hideo ^b  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

A. Semiconductors; B. Epitaxy; D. Optical properties; E. X ray and ray spectroscopies

Indexed keywords

EPITAXIAL GROWTH; OPTICAL PROPERTIES; OPTOELECTRONIC DEVICES; PULSED LASER DEPOSITION; SEMICONDUCTOR MATERIALS; THIN FILMS; X RAY SPECTROSCOPY;

SINGLE-PHASED FILMS;

ZINC COMPOUNDS;

EID: 0036894291     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(02)00600-2     Document Type: Article

References (18)

1. Guha S., Wu B.J., Cheng H., DePuydt J.M. Appl. Phys. Lett. 63:1993;2129.
2. Sou I.K., Yang Z., Mao J., Ma Z.H., Tong K.W., Yu P., Wong G.K.L. Appl. Phys. Lett. 69:1996;2519.
3. Ozanyan K.B., Nicholls J.E., May L., Hogg J.H.C., Hagston W.E., Lunn B., Ashenford D.E. Solid State Commun. 99:1996;407.
4. Ichino K., Ueyama K., Yamamoto M., Kariya H., Miyata H., Misasa H., Kitagawa M., Kobayashi H. J. Appl. Phys. 87:2000;4249.
5. Telfer S.A., Morhain C., Urbaszek B., O'Donnell C., Tomasini P., Balocchi A., Prior K.A., Cavenett B.C. J. Cryst. Growth. 214/215:2000;197.
6. Yamada Y., Yamamoto T., Nakamura S., Taguchi T., Sasaki F., Kobayashi S., Tani T. Appl. Phys. Lett. 69:1996;88.
7. Summers C.J., Tong W., Tran T.K., Ogle W., Park W., Wagner B.K. J. Cryst. Growth. 159:1996;64.
8. Tran T.K., Park W., Tong W., Kyi M.M., Wagner B.K., Summers C.J. J. Appl. Phys. 81:1997;2803.
9. Nakamura S., Sakashita T., Yamada Y., Taguchi T. J. Cryst. Growth. 184/185:1998;1110.
10. Nakamura S., Takagimoto S., Ando T., Kugiyama H., Yamada Y., Taguchi T. J. Cryst. Growth. 221:2000;388.
11. Chrisey D.B., Huber G.K. Pulsed Laser Deposition of Thin Films. 1994;Wiley, New York.
12. McCamy J.W., Lowndes D.H., Budai J.D., Zuhr R.A., Zhang X. J. Appl. Phys. 73:1993;7818.
13. McLaughlin M., Sakeek H.F., Maguire P., Graham W.G., Molloy J., Morrow T., Laverty S., Anderson J. Appl. Phys. Lett. 63:1993;1865.
14. Shen W.P., Kwok H.S. Appl. Phys. Lett. 65:1994;2162.
15. Yoo Y.-Z., Chikyow T., Ahmet P., Kawasaki M., Makino T., Segawa Y., Koinuma H. Adv. Mater. 13:2001;1624.
16. Holy V., Pietsch U., Baumbach T. High resolution x-ray scattering from thin film and multilayers, Springer Tracts in Modern Physics No. 149. 1999;Springer, Berlin.
17. Husberg O., Khartchenko A., As D.J., Vogelsang H., Fery T., Schikora D., Lischka K., Noriega O.C., Tabata A., Leite J.R. Appl. Phys. Lett. 79:2001;1243.
18. Passler R., Griebl E., Riepl H., Lautner G., Bauer S., Preis H., Gebhardt W., Buda B., As D.J., Schikora D., Lischka K., Papagelis K., Ves S. J. Appl. Phys. 86:1999;4403.