Nonlinearities, the generators perspective in ADC statistical testing techniques

11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001

Volumn , Issue , 2001, Pages 544-548

  Martins, Raul Carneiro ^a   Serra, António Cruz ^a  

^a INSTITUTO SUPERIOR TÉCNICO   (Portugal)

Author keywords

Histogram method; Nonlinearity measurement; Probability density function distortion

Indexed keywords

ANALOG TO DIGITAL CONVERSION; GRAPHIC METHODS; PROBABILITY DENSITY FUNCTION;

DEGREE OF NON-LINEARITY; EXPERIMENTAL METHODS; HISTOGRAM METHOD; NONLINEARITY MEASUREMENTS; STATISTICAL TESTING; STIMULUS SIGNALS;

ELECTRIC VARIABLES MEASUREMENT;

EID: 84943261307     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. IEEE Standard 1057-1994, "IEEE Standard for Digitizing Waveform Recorders", Dec. 1994.
2. R. Martins, A. Serra, "Automated ADC Characterisation using the Histogram Test stimulated by Gaussian Noise", IEEE Trans. on Instr. and Meas., vol. 48, n. 2, pp. 471-474, April, 1999.
3. R. Martins, A. Serra "ADC Characterisation by using the Histogram Test stimulated by Gaussian Noise. Theory and experimental results", Measurement, vol. 27, n. 4, pp. 291-300
4. B. M. Oliver, J. M. Cage, "Electronic Measurements and Instrumentation", chap. 4, 1st ed., McGraw-Hill, Inter-University Electronic Series, vol. 12, 1971
5. A. Papoulis, "Probability, Random Variables, and Stochastic Processes", McGraw-Hill International, 3rd Edition, 1991.