Silicon as a standard material for infrared reflectance and transmittance from 2 to 5 μm

Infrared Physics and Technology

Volumn 43, Issue 6, 2002, Pages 389-396

  Kaplan, Simon G ^a   Hanssen, Leonard M ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Index of refraction; Infrared; Polarization; Reflectance; Transmittance

Indexed keywords

FOURIER TRANSFORM INFRARED SPECTROSCOPY; LIGHT POLARIZATION; LIGHT REFLECTION; LIGHT TRANSMISSION; MIRRORS; OPTICAL RESOLVING POWER; REFRACTIVE INDEX; SILICON; SINGLE CRYSTALS; SPECTROPHOTOMETERS; SPECTRUM ANALYSIS; THERMAL EFFECTS;

INFRARED REFLECTANCE;

INFRARED RADIATION;

EID: 0036887436     PISSN: 13504495     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4495(02)00161-5     Document Type: Article

References (10)

1. Wooten F. Optical Properties of Solids. 1972;Academic Press, New York. pp. 1-172.
2. F.J.J. Clarke, Infrared reflectance standards from NPL, in: Developments in Optical Component Coatings, SPIE vol. 2776 (1996) pp. 184-195.
3. Palmer J.A. The measurement of transmission, absorption, emission, and reflection. Bass M. Handbook of Optics. Vol. 2:1995;25.11 McGraw-Hill, New York.
4. Hanssen L., Kaplan S. Methods for absolute reflectance measurement of transmissive materials in the infrared. Proc. SPIE. 3425:1998;16-27.
5. Zhang Z.M., Hanssen L.M., Datla R.U. Polarization-dependent angular reflectance of silicon and germanium in the infrared. Infr. Phys. Techno. 1995.
6. Kaplan S.G., Hanssen L.M. Angle-dependent absolute infrared reflectance and transmittance measurements. Proc. SPIE. 4103:2000;75-84.
7. Dummer D.J., Kaplan S.G., Hanssen L.M., Pine A.S., Zong Y. High-quality Brewster's angle polarizer for broadband infrared application. Appl. Opt. 37:1998;1194.
8. Palik E.D. Handbook of Optical Constants of Solids. 1985;Academic, Orlando, FL. p. 566.
9. Birch J.R., Clarke F.J.J. Fifty categories of ordinate error in Fourier transform spectroscopy. Spectrosc. Europe. 7:1995;16-22.
10. Kaplan S.G., Hanssen L.M., Datla R.U. Testing the radiometric accuracy of Fourier transform infrared transmittance measurements. Appl. Opt. 36:1997;8896.