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Volumn 36, Issue 34, 1997, Pages 8896-8908

Testing the radiometric accuracy of Fourier transform infrared transmittance measurements

Author keywords

Fourier transform infrared spectrophotometer; Neutral density filter; Photometric accuracy; Transmittance

Indexed keywords


EID: 0000449321     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.008896     Document Type: Article
Times cited : (33)

References (22)
  • 2
    • 0017995003 scopus 로고
    • Sensitivity of a Fourier transform infrared spectrometer
    • D. R. Mattson, “Sensitivity of a Fourier transform infrared spectrometer,” Appl. Spectrosc. 32, 335-338 (1978)
    • (1978) Appl. Spectrosc , vol.32 , pp. 335-338
    • Mattson, D.R.1
  • 3
    • 0344631995 scopus 로고
    • Accurate infrared transmittance measurements on optical filters using an FT-IR spectrometer
    • D. A. C. Comp-ton, J. Drab, and H. S. Barr, “Accurate infrared transmittance measurements on optical filters using an FT-IR spectrometer,” Appl. Opt. 29, 2908-2912 (1980).
    • (1980) Appl. Opt. , vol.29 , pp. 2908-2912
    • Comp-Ton, D.A.C.1    Drab, J.2    Barr, H.S.3
  • 4
    • 0021469472 scopus 로고
    • Nonlinear detector response in FT-IR
    • D. B. Chase, “Nonlinear detector response in FT-IR,” Appl. Spectrosc. 38, 491-494 (1984).
    • (1984) Appl. Spectrosc. , vol.38 , pp. 491-494
    • Chase, D.B.1
  • 5
    • 0019010676 scopus 로고
    • Spectrum distortion in far-infrared Fourier spectroscopy by multiple reflections between sample and Michelson interferometer
    • H. W. H. M. Jongbloets, M. J. H. Van de Steeg, E. J. C. M. Van der Werf, J. H. M. Stoelinga, and P. Wyder, “Spectrum distortion in far-infrared Fourier spectroscopy by multiple reflections between sample and Michelson interferometer,” Infrared Phys. 20, 185-192 (1980).
    • (1980) Infrared Phys , vol.20 , pp. 185-192
    • Jongbloets, H.W.H.M.1    Van De Steeg, M.J.H.2    Van Der Werf, E.J.C.M.3    Stoelinga, J.H.M.4    Wyder, P.5
  • 6
    • 85010133097 scopus 로고
    • Dispersive vs. FTIR photometric accuracy—can it be measured?
    • C. Burgess and K. D. Mielenz, eds. (Elsevier, Amsterdam
    • M. A. Ford, “Dispersive vs. FTIR photometric accuracy—can it be measured?” in Advances in Standards and Methodology in Spectrophotometry, C. Burgess and K. D. Mielenz, eds. (Elsevier, Amsterdam, 1987), pp. 359-366.
    • (1987) Advances in Standards and Methodology in Spectrophotometry , pp. 359-366
    • Ford, M.A.1
  • 7
    • 0023345631 scopus 로고
    • The removal of detector port radiation effects in power transmission or reflection Fourier transform spectroscopy
    • J. R. Birch and E. A. Nicol, “The removal of detector port radiation effects in power transmission or reflection Fourier transform spectroscopy,” Infrared Phys. 27, 159-165 (1987)
    • (1987) Infrared Phys , vol.27 , pp. 159-165
    • Birch, J.R.1    Nicol, E.A.2
  • 8
    • 0021458288 scopus 로고
    • Source of a problem with Fourier transform spectroscopy
    • D. B. Tanner and R. P. McCall, “Source of a problem with Fourier transform spectroscopy,” Appl. Opt. 23, 2363-2368 (1984).
    • (1984) Appl. Opt. , vol.23 , pp. 2363-2368
    • Tanner, D.B.1    McCall, R.P.2
  • 9
    • 0002931823 scopus 로고
    • Fifty categories of ordinate error in Fourier transform spectroscopy
    • J. R. Birch and F. J. J. Clarke, “Fifty categories of ordinate error in Fourier transform spectroscopy,” Spectrosc. Europe 7, 16-22 (1995).
    • (1995) Spectrosc. Europe , vol.7 , pp. 16-22
    • Birch, J.R.1    Clarke, F.J.J.2
  • 11
    • 0005238359 scopus 로고
    • Influence of nonequivalent detector responsivity on FT-IR photometric accuracy
    • M. I. Flik and Z. M. Zhang, “Influence of nonequivalent detector responsivity on FT-IR photometric accuracy,” J. Quant. Spectrosc. Radiat. Transfer 47, 293-303 (1992).
    • (1992) J. Quant. Spectrosc. Radiat. Transfer , vol.47 , pp. 293-303
    • Flik, M.I.1    Zhang, Z.M.2
  • 13
    • 84975571152 scopus 로고
    • Refractive indexes and temperature coefficients of germanium and silicon
    • H. W. Icenogle, B. C. Platt, and W. L. Wolfe, “Refractive indexes and temperature coefficients of germanium and silicon,” Appl. Opt. 15, 2348-2351 (1976)
    • (1976) Appl. Opt. , vol.15 , pp. 2348-2351
    • Icenogle, H.W.1    Platt, B.C.2    Wolfe, W.L.3
  • 14
    • 0009394030 scopus 로고
    • Refractive index of silicon
    • W. Primak, “Refractive index of silicon,” Appl. Opt. 10, 759-763 (1971)
    • (1971) Appl. Opt. , vol.10 , pp. 759-763
    • Primak, W.1
  • 15
    • 0011122088 scopus 로고
    • Infrared refractive indices of silicon, germanium, and modified selenium glass
    • C. D. Salzberg and J. J. Villa, “Infrared refractive indices of silicon, germanium, and modified selenium glass,” J. Opt. Soc. Am. 47, 244-246 (1957).
    • (1957) J. Opt. Soc. Am. , vol.47 , pp. 244-246
    • Salzberg, C.D.1    Villa, J.J.2
  • 16
    • 84975538295 scopus 로고
    • Infrared refractive index of silicon
    • D. F. Edwards and E. Ochoa, “Infrared refractive index of silicon,” Appl. Opt. 19, 4130-4131 (1980).
    • (1980) Appl. Opt. , vol.19 , pp. 4130-4131
    • Edwards, D.F.1    Ochoa, E.2
  • 17
    • 0028515647 scopus 로고
    • Broadband high-optical-density filters in the infrared
    • A. Frenkel and Z. M. Zhang, “Broadband high-optical-density filters in the infrared,” Opt. Lett. 19, 1495-1497 (1994).
    • (1994) Opt. Lett. , vol.19 , pp. 1495-1497
    • Frenkel, A.1    Zhang, Z.M.2
  • 18
    • 0010319663 scopus 로고
    • Use of heterodyne detection to measure optical transmittance over a wide range
    • A. L. Migdall, B. Roop, Y. C. Zheng, J. E. Hardis, and G. J. Xia, “Use of heterodyne detection to measure optical transmittance over a wide range,” Appl. Opt. 29, 5136-5144 (1990).
    • (1990) Appl. Opt. , vol.29 , pp. 5136-5144
    • Migdall, A.L.1    Roop, B.2    Zheng, Y.C.3    Hardis, J.E.4    Xia, G.J.5
  • 19
    • 0003513083 scopus 로고
    • Guidelines for evaluating and expressing the uncertainty of NIST measurement results
    • 1297 (U.S. GPO, Washington, DC
    • B. N. Taylor and C. E. Kuyatt, “Guidelines for evaluating and expressing the uncertainty of NIST measurement results,” NIST Tech. Note 1297 (U.S. GPO, Washington, DC, 1994).
    • (1994) NIST Tech. Note
    • Taylor, B.N.1    Kuyatt, C.E.2
  • 20
    • 84975586420 scopus 로고
    • High-optical-density out-of-band spectral transmittance measurements of bandpass filters
    • Z. M. Zhang, L. M. Hanssen, and R. U. Datla, “High-optical-density out-of-band spectral transmittance measurements of bandpass filters,” Opt. Lett. 20, 1077-1079 (1995).
    • (1995) Opt. Lett. , vol.20 , pp. 1077-1079
    • Zhang, Z.M.1    Hanssen, L.M.2    Datla, R.U.3
  • 21
    • 84975664226 scopus 로고
    • Physical parameters in high-accuracy spectrophotometry
    • Spec. Publ. 378 (U.S. GPO, Washington, DC
    • K. D. Mielenz, “Physical parameters in high-accuracy spectrophotometry,” Natl. Bur. Stand. (U.S.) Spec. Publ. 378 (U.S. GPO, Washington, DC, 1973).
    • (1973) Natl. Bur. Stand. (U.S.)
    • Mielenz, K.D.1
  • 22
    • 0031122876 scopus 로고    scopus 로고
    • Methods for correcting nonlinearity errors in Fourier transform infrared spectrometers
    • Z. M. Zhang, C. J. Zhu, and L. M. Hanssen, “Methods for correcting nonlinearity errors in Fourier transform infrared spectrometers,” Appl. Spectrosc. 51, 576-579 (1997).
    • (1997) Appl. Spectrosc. , vol.51 , pp. 576-579
    • Zhang, Z.M.1    Zhu, C.J.2    Hanssen, L.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.