Angle-dependent absolute infrared reflectance and transmittance measurements

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4103, Issue , 2000, Pages 75-84

  Kaplan, Simon G ^a   Hanssen, Leonard M ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GONIOMETERS; INFRARED RADIATION; INFRARED SPECTROPHOTOMETERS; LIGHT POLARIZATION; LIGHT REFLECTION; LIGHT TRANSMISSION; OPTICAL VARIABLES MEASUREMENT; PHOTOCONDUCTING DEVICES; PHOTODETECTORS; REFRACTIVE INDEX;

BREWSTER-ANGLE POLARIZER; FRESNEL EQUATIONS;

OPTICAL SYSTEMS;

EID: 0033658609     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.403573     Document Type: Conference Paper

References (7)