Methods for absolute reflectance measurement of transmissive materials in the infrared

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3425, Issue , 1998, Pages 16-27

  Hanssen, Leonard ^a   Kaplan, Simon ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GONIOMETERS; INFRARED TRANSMISSION; OPTICAL FILTERS; OPTICAL MATERIALS; SPECTROPHOTOMETERS;

ABSOLUTE REFLECTANCE;

LIGHT REFLECTION;

EID: 0032402995     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.326674     Document Type: Conference Paper

References (12)

1. Integrating sphere system for absolute measurement of infrared transmittance, reflectance and absorptance of specular samples
2. Reflectance spectroscopy: An overview of classification and techniques
3. Absolute specular reflectometer with an autocollimator telescope and auxiliary mirrors
4. Infrared regular reflectance standards from NPL
5. Infrared diffuse reflectance instrumentation and standards at NIST
6. Integrating sphere designs with isotropic throughput
7. Problems posed by scattering transmissive materials for accurate transmittance and reflectance measurements
8. Infrared regular reflectance instrumentation and standards at NIST
9. Improved integrating sphere throughput with a lens and nonimaging concentrator