Low energy electron microscopy/diffraction study on growth of Ge on Si(113) surface

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 20, Issue 6, 2002, Pages 2496-2499

  Yasue, T ^a   Koshikawa, T ^a   Bauer, E ^b  

^a OSAKA ELECTRO COMMUNICATION UNIVERSITY   (Japan)

^b ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; LOW ENERGY ELECTRON DIFFRACTION; MONOLAYERS; SEMICONDUCTING SILICON; SEMICONDUCTOR GROWTH;

LOW ENERGY ELECTRON MICROSCOPY; SEMICONDUCTOR HETEROEPITAXIAL SYSTEM; SPOT INTENSITY;

SEMICONDUCTING GERMANIUM;

EID: 0036883111     PISSN: 0734211X     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1523374     Document Type: Article

References (17)

1. B. Voigtländer, Surf. Sci. Rep. 43, 127 (2001), and references therein.
2. D. J. Eaglesham, A. E. White, L. C. Feldman, N. Moriya, and D. C. Jacobson, Phys. Rev. Lett. 70, 1643 (1993).
3. M. Bermond, J. J. Métois, X. Egéa, and F. Floret, Surf. Sci. 330, 48 (1995).
4. J. Knall and J. B. Pethica, Surf. Sci. 265, 154 (1992).
5. H. Omi and T. Ogino, Phys. Rev. B 59, 7521 (1999).
6. J.-H. Zhu, C. Miesner, K. Brunner, and G. Abstreiter, Appl. Phys. Lett. 75, 2395 (1999).
7. Z. Zhang, K. Sumitomo, H. Omi, and T. Ogino, Surf. Sci. 497, 93 (2002).
8. E. Bauer, Rep. Prog. Phys. 57, 895 (1994).
9. T. Yasue, T. Koshikawa, M. Jalochowski, and E. Bauer, Surf. Sci. 493, 381 (2001).
10. T. Yasue, T. Koshikawa, and E. Bauer, (unpublished).
11. P. Adamec, E. Bauer, and B. Lenocová, Rev. Sci. Instrum. 69, 3583 (1998).
12. J. Schreiner, K. Jacobi, and W. Selke, Phys. Rev. B 49, 2706 (1994).
13. Y. Kajiyama, Y. Tanishiro, and K. Takayanagi, Surf. Sci. 222, 47 (1989).
14. Y.-W. Mo, D. E. Savage, B. S. Swartzentruber, and M. G. Lagally, Phys. Rev. Lett. 65, 1020 (1990).
15. M. Horn-von Hoegen, B. H. Müller, A. Al-Falou, and M. Henzler, Phys. Rev. Lett. 71, 3170 (1993).
16. P. Sutter and M. G. Lagally, Phys. Rev. Lett. 84, 4637 (2000).
17. R. M. Tromp, F. M. Ross, and M. C. Reuter, Phys. Rev. Lett. 84, 4641 (2000).