LEEM observation of formation of Cu nano-islands on Si(1 1 1) surface by hydrogen termination

Surface Science

Volumn 493, Issue 1-3, 2001, Pages 381-388

  Yasue, T ^a   Koshikawa, T ^a   Jalochowski, M ^b   Bauer, E ^c  

^a OSAKA ELECTRO COMMUNICATION UNIVERSITY   (Japan)

^b MARIA CURIE SK ODOWSKA UNIVERSITY   (Poland)

^c ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Copper; Growth; Low energy electron diffraction (LEED); Low energy electron microscopy (LEEM); Semiconducting films; Silicon

Indexed keywords

COPPER; ELECTRON ENERGY LEVELS; ELECTRON MICROSCOPY; HYDROGEN; LOW ENERGY ELECTRON DIFFRACTION; NANOSTRUCTURED MATERIALS; SEMICONDUCTING FILMS;

HYDROGEN TERMINATION;

SEMICONDUCTING SILICON;

EID: 0035501430     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01243-2     Document Type: Conference Paper

References (20)