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Volumn 41, Issue 11, 2002, Pages 6413-6416

Visible photoluminescence from evaporated SiOx thin films

Author keywords

Infrared spectrometry; Photoluminescence; Quantum confinement; SiO2; Thermal evaporation; Thin film

Indexed keywords

EVAPORATION; INFRARED SPECTROMETERS; IRRADIATION; PHOTOLUMINESCENCE; SILICA; SUBSTRATES; ULTRAVIOLET RADIATION; VACUUM;

THERMAL EVAPORATION;

THIN FILMS;

EID: 0036873142 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.41.6413 Document Type: Article

Times cited : (3)

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