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Volumn 52, Issue 11, 2002, Pages 1274-1280

Decomposition of SF6 in an RF Plasma Environment

Author keywords

[No Author keywords available]

Indexed keywords

DECOMPOSITION; ETCHING; EXHAUST GASES; PLASMAS;

EID: 0036826909     PISSN: 10962247     EISSN: 21622906     Source Type: Journal    
DOI: 10.1080/10473289.2002.10470864     Document Type: Article
Times cited : (51)

References (24)
  • 1
    • 0019399404 scopus 로고
    • SF6, A Preferable Etchant for Plasma Etching Silicon
    • 6, A Preferable Etchant for Plasma Etching Silicon; J. Electrochem. Soic. 1981, 128, 123-126.
    • (1981) J. Electrochem. Soic , vol.128 , pp. 123-126
    • Eisele, K.M.1
  • 4
    • 0033621663 scopus 로고    scopus 로고
    • Sulfur Hexafluoride (SFc): Global Environmental Effects and Toxic Byproducts Formation
    • Dervos, C.T. Sulfur Hexafluoride (SFc): Global Environmental Effects and Toxic Byproducts Formation; J. Ait & Waste Manage. Assoc. 2000, 50, 137-141.
    • (2000) J. Ait & Waste Manage. Assoc , vol.50 , pp. 137-141
    • Dervos, C.T.1
  • 5
    • 0022704633 scopus 로고
    • Electron and Chemical Kinetics in the Low-Pressure RF Discharge Etching of Silicon in SFc
    • Kline, L.E. Electron and Chemical Kinetics in the Low-Pressure RF Discharge Etching of Silicon in SFc; IEEE Ttans. Plasma Sci. 1986, PS-14, 145-155.
    • (1986) IEEE Ttans. Plasma Sci. , vol.14 , pp. 145-155
    • Kline, L.E.1
  • 6
    • 0022790632 scopus 로고
    • SF6 Decomposition in Gas-Insulated Equipment
    • Chu, F.Y. SF6 Decomposition in Gas-Insulated Equipment; IEEE Ttans. Electt. Insul. 1986, 21, 693-725.
    • (1986) IEEE Ttans. Electt. Insul , vol.21 , pp. 693-725
    • Chu, F.Y.1
  • 8
    • 0025693111 scopus 로고
    • Conference Record of the IEEE International Symposium on Electrical Insulation, Toronto, Canada, June 3-6
    • 6-Insu-lated Equipment. In Conference Record of the IEEE International Symposium on Electrical Insulation, Toronto, Canada, June 3-6, 1990; p 248-252.
    • (1990) 6-Insu-Lated Equipment , pp. 248-252
    • Olthoff, J.K.1    Van Brunt, R.J.2    Herron, J.T.3
  • 10
    • 0028587494 scopus 로고
    • Conference Record of the IEEE International Symposium on Electrical Insulation, Pittsburgh, PA, June 5-8
    • 6. In Conference Record of the IEEE International Symposium on Electrical Insulation, Pittsburgh, PA, June 5-8, 1994; p 518-521.
    • (1994) 6 , pp. 518-521
    • Sauser, I.1    Mahajan, S.M.2    Cacheiro, R.A.3
  • 12
    • 0031478672 scopus 로고    scopus 로고
    • Investigation of the Low-Pressure Plasma-Chemical Conversion of Fluorocarbon Waste Gases
    • Breitbarth, F.W.; Berg, D.; Dumke, K.; Tiller, H.-J. Investigation of the Low-Pressure Plasma-Chemical Conversion of Fluorocarbon Waste Gases; Plasma Chem. Plasma Process. 1997, 17 (1), 39-57.
    • (1997) Plasma Chem. Plasma Process , vol.17 , Issue.1 , pp. 39-57
    • Breitbarth, F.W.1    Berg, D.2    Dumke, K.3    Tiller, H.-J.4
  • 17
    • 0018500871 scopus 로고
    • The Plasma Oxidation of CF4 in a Tubu-lar-Alumina Fast-Flow Reactor
    • 4 in a Tubu-lar-Alumina Fast-Flow Reactor; J. Appl. Phys. 1979, 50, 4982-4987.
    • (1979) J. Appl. Phys , vol.50 , pp. 4982-4987
    • Smolinsky, G.1    Flamm, D.L.2
  • 18
    • 0021494806 scopus 로고
    • Computer Simulation of a CF4 Plasma Etching Silicon
    • 4 Plasma Etching Silicon; J. Appl. Phys. 1984, 56, 1522-1531.
    • (1984) J. Appl. Phys , vol.56 , pp. 1522-1531
    • Edelson, D.1    Flamm, D.L.2
  • 23
    • 0025214051 scopus 로고
    • Fluoride in Workplace Air and in Urine of Workers Concerning Fluorspar
    • Rees, D.; Rama, D.B.K.; Yousefi, V. Fluoride in Workplace Air and in Urine of Workers Concerning Fluorspar; Am. J. Ind. Med. 1990, 17, 311-320.
    • (1990) Am. J. Ind. Med , vol.17 , pp. 311-320
    • Rees, D.1    Rama, D.B.K.2    Yousefi, V.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.