TiOx interlayer characterization for sol-gel derived Pb(Zr, Ti)O3 thin films on titanium foil

Journal of Materials Science: Materials in Electronics

Volumn 13, Issue 10, 2002, Pages 601-604

  Zou, Q ^a   Ruda, H E ^a   Sodhi, R N ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ANNEALING; DIELECTRIC PROPERTIES; INTERFACES (MATERIALS); LEAD COMPOUNDS; PEROVSKITE; SCANNING ELECTRON MICROSCOPY; SOL-GELS; TEMPERATURE; TITANIUM; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

DIELECTRIC LOSS; DIELECTRIC PROPERTY MEASUREMENT; LEAD ZIRCONATE TITANATE; SOL-GEL PROCESSING;

THIN FILMS;

EID: 0036807079     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1020156316175     Document Type: Article

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