Absolute distance measurement by two-point-diffraction interferometry

Applied Optics

Volumn 41, Issue 28, 2002, Pages 5921-5928

  Rhee, Hyug Gyo ^a   Kim, Seung Woo ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036795313     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.005921     Document Type: Article

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