Texture characterization and defect detection using adaptive wavelets

Optical Engineering

Volumn 35, Issue 11, 1996, Pages 3140-3149

  Jasper, Warren J ^a   Gamier, Stephen J ^a   Potlapalli, Harsh ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

Adaptive wavelet bases; Defect detection; Texture characterization

Indexed keywords

EID: 0001513901     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.601054     Document Type: Article

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