Optimal textural features for flaw detection in textile materials

IEEE Region 10 Annual International Conference, Proceedings/TENCON

Volumn 1, Issue , 1997, Pages 307-310

  Bodnarova, Adriana ^a   Williams, John A ^a   Bennamoun, Mohammed ^a   Kubik, Kurt K ^a  

^a QUEENSLAND UNIVERSITY OF TECHNOLOGY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EDGE DETECTION; FABRICS; MATRIX ALGEBRA; QUALITY CONTROL; TEXTURES;

SPATIAL GRAY LEVEL DEPENDENCE MATRICES (SGLDM);

FEATURE EXTRACTION;

EID: 0031361049     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)