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Volumn 517, Issue 1-3, 2002, Pages 138-150
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Determination of growth modes of Cu on O/Ni(1 0 0) and NiO(1 0 0) surfaces by SIMS and secondary electron emission measurements
a
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Author keywords
Copper; Metallic films; Nickel; Oxygen; Secondary ion mass spectroscopy; Sputtering
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Indexed keywords
ADSORPTION;
COPPER;
CRYSTAL ORIENTATION;
DEPOSITION;
FILM GROWTH;
METALLIC FILMS;
NICKEL;
SECONDARY EMISSION;
SECONDARY ION MASS SPECTROMETRY;
METALLIC CLUSTERS;
SURFACE CHEMISTRY;
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EID: 0036783654
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(02)02060-5 Document Type: Article |
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Times cited : (10)
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References (39)
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