Theoretical analysis of the growth mode for thin metallic films on oxide substrates

Physical Review Letters

Volumn 85, Issue 20, 2000, Pages 4333-4336

  Fuks, David ^a,b   Dorfman, Simon ^c   Kotomin, Eugene A ^d,e   Zhukovskii, Yuri F ^d,f   Stoneham, A Marshall ^f  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

^b UNIVERSITY OF OSNABRÜCK   (Germany)

^c TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^d UNIVERSITY OF LATVIA   (Latvia)

^e MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^f UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ATOMS; CARRIER MOBILITY; DEPOSITION; FILM GROWTH; INTERFACES (MATERIALS); MAGNESIA; NUMERICAL ANALYSIS; OXIDES; SILVER; SUBSTRATES; THERMODYNAMIC PROPERTIES;

SPINODAL DECOMPOSITION; SUPERSTRUCTURE;

METALLIC FILMS;

EID: 0034315831     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.4333     Document Type: Article

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